Control analyser NEX QC+

Product ID : 273

Quick Description

Tested parameter: control, X-ray

Applications: laboratory

Configuration: compact, benchtop
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High-Resolution Energy Dispersive X‑ray Fluorescence (EDXRF) Analyzer

Elemental analysis of solids, liquids, powders, alloys and thin films
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.

EDXRF for quality control applications
Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with high precision and broad elemental coverage
The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

EDXRF with autosampler and helium purge options
Options include automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

Features
Non-destructive elemental analysis for sodium (Na) to uranium (U)
Combines superior performance with affordability
Solids, liquids, alloys, powders and thin films
Lightweight, small footprint, and does not require an external PC
Icon-driven touchscreen interface and built-in printer

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